DocumentCode
3411539
Title
On the road to building-in reliability
Author
Erhart, D.L. ; Schafft, H.A. ; Gladden, W.K.
Author_Institution
Motorola Inc., Tempe, AZ, USA
fYear
1995
fDate
22-25 Oct. 1995
Firstpage
5
Lastpage
10
Abstract
The cycle-time pressures to reduce the time required to introduce new products, and the continued demands for decreasing product failure rates are pushing our existing reliability risk management methodology to its limits. These issues have stimulated the reassessment of our strategy and the development of an alternate approach. In this presentation, we explore the implementation of building-in reliability (BIR). We develop working definitions for BIR and the present reliability risk assessment methodology, testing-in reliability (TIR). We contrast the TIR and BIR approaches in the context of a new product introduction (NPI) process, as well as in the context of day-to-day manufacturing. We examine the TIR and BIR approaches to metallization reliability, and develop a straw man proposal for the implementation of BIR.
Keywords
failure analysis; integrated circuit metallisation; integrated circuit reliability; production testing; risk management; building-in reliability; cycle-time pressures; metallization reliability; new product introduction; product failure rates; reliability risk management methodology; straw man proposal; testing-in reliability; Equations; Manufacturing processes; Marketing and sales; Metallization; NIST; Proposals; Qualifications; Risk management; Technology management; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop, 1995. Final Report., International
Conference_Location
Lake Tahoe, CA, USA
Print_ISBN
0-7803-2705-5
Type
conf
DOI
10.1109/IRWS.1995.493567
Filename
493567
Link To Document