Title :
Ferroelectric capacitor compact model including dynamic and temperature behavior
Author :
Supriyanto, E. ; Schultz, I. ; Ullmann, M. ; Goebel, H.
Author_Institution :
Inst. of Electron., Univ. of the Fed. Armed Forces, Hamburg, Germany
fDate :
28 May-1 June 2002
Abstract :
An accurate model of the ferroelectric capacitor is essential for the design and optimization of ferroelectric memories. In this paper a compact model is presented that takes into account all important effects including temperature and dynamic behavior. The model is based on the Preisach theory and the Distribution Function Integral Method. The dynamic behavior has been modeled by a first order differential equation with a variable switching time parameter. Based on measurement results, it can be shown that the switching time parameter is only a function of the slew rate of input voltages. The temperature dependence of the hysteresis parameters has been modeled successfully using the Landau-Devonshire theory and curve fitting. Measurements and simulation results of the dynamic hysteresis curves at different slew rates and temperatures have been compared, and the results show a high accuracy over a wide range of operation.
Keywords :
dielectric hysteresis; dielectric polarisation; differential equations; ferroelectric capacitors; ferroelectric storage; Distribution Function Integral Method; Landau-Devonshire theory; Preisach theory; curve fitting; design; dynamic behavior; dynamic hysteresis curves; ferroelectric capacitor compact model; ferroelectric memories; first order differential equation; input voltages; optimization; slew rate; switching time parameter; temperature behavior; variable switching time parameter; Capacitors; Curve fitting; Design optimization; Differential equations; Distribution functions; Ferroelectric materials; Hysteresis; Temperature dependence; Time measurement; Voltage;
Conference_Titel :
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
Print_ISBN :
0-7803-7414-2
DOI :
10.1109/ISAF.2002.1195870