Title :
An ultrasensitive uncooled heat-balancing infrared detector
Author :
Liu, C.C. ; Mastrangelo, C.H.
Author_Institution :
Center for Integrated Sensors & Circuits, Michigan Univ., Ann Arbor, MI, USA
Abstract :
In this paper we report the fabrication and initial testing of a highly sensitive uncooled infrared detector based on an active heat balancing technique. The detector is fabricated using a commercial CMOS process plus an electrochemical etch releasing step. The basic active detector structure consists of a simple cascode CMOS amplifier in which the PMOS devices are built inside a thermally-isolated floating n-well. The intrinsic coupling of the cascode currents with the self heating of the well forms an electrothermal feedback loop that tends to maintain the well temperature constant. By employing the heat balance between incoming infrared radiation and the PMOS device power dissipation, the responsivity of the detector is controlled by the cascode biasing current. Initial measurements show responsivities between 0.3-1.2/spl times/10/sup 6/ V/W when the infrared source is chopped at 20 Hz and a detectivity D*=10/sup 7/ cm /spl radic/(Hz)W/sup -1/ at 30 Hz. The observed device responsivity is one order of magnitude higher than that reported for passive uncooled VO/sub 2/ microbolometers.
Keywords :
CMOS integrated circuits; infrared detectors; PMOS device; active heat balancing; cascode CMOS amplifier; detectivity; electrochemical etch release step; electrothermal feedback loop; responsivity; sensitivity; thermally-isolated floating n-well; uncooled infrared detector; CMOS process; Electrothermal effects; Etching; Fabrication; Feedback loop; Infrared detectors; Infrared heating; MOS devices; Temperature; Testing;
Conference_Titel :
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3393-4
DOI :
10.1109/IEDM.1996.554043