• DocumentCode
    3411713
  • Title

    An ultrasensitive uncooled heat-balancing infrared detector

  • Author

    Liu, C.C. ; Mastrangelo, C.H.

  • Author_Institution
    Center for Integrated Sensors & Circuits, Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1996
  • fDate
    8-11 Dec. 1996
  • Firstpage
    549
  • Lastpage
    552
  • Abstract
    In this paper we report the fabrication and initial testing of a highly sensitive uncooled infrared detector based on an active heat balancing technique. The detector is fabricated using a commercial CMOS process plus an electrochemical etch releasing step. The basic active detector structure consists of a simple cascode CMOS amplifier in which the PMOS devices are built inside a thermally-isolated floating n-well. The intrinsic coupling of the cascode currents with the self heating of the well forms an electrothermal feedback loop that tends to maintain the well temperature constant. By employing the heat balance between incoming infrared radiation and the PMOS device power dissipation, the responsivity of the detector is controlled by the cascode biasing current. Initial measurements show responsivities between 0.3-1.2/spl times/10/sup 6/ V/W when the infrared source is chopped at 20 Hz and a detectivity D*=10/sup 7/ cm /spl radic/(Hz)W/sup -1/ at 30 Hz. The observed device responsivity is one order of magnitude higher than that reported for passive uncooled VO/sub 2/ microbolometers.
  • Keywords
    CMOS integrated circuits; infrared detectors; PMOS device; active heat balancing; cascode CMOS amplifier; detectivity; electrochemical etch release step; electrothermal feedback loop; responsivity; sensitivity; thermally-isolated floating n-well; uncooled infrared detector; CMOS process; Electrothermal effects; Etching; Fabrication; Feedback loop; Infrared detectors; Infrared heating; MOS devices; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1996. IEDM '96., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-3393-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1996.554043
  • Filename
    554043