• DocumentCode
    3411798
  • Title

    Broad band microwave probe for nondestructive test of dielectric coatings

  • Author

    Grishin, A.M. ; Denysenkov, V.P.

  • Author_Institution
    Dept. of Condensed Matter Phys., R. Inst. of Technol., Stockholm, Sweden
  • fYear
    2002
  • fDate
    28 May-1 June 2002
  • Firstpage
    91
  • Lastpage
    93
  • Abstract
    We report on nondestructive characterization of Thermal Barrier Coatings (TBC: YSZ/MCrAlY/Ni-superalloy). To test TBC we have employed the method of electromagnetic defectoscopy. We have modernized this method by applying microwave probe instead of RF coil: an open-ended coaxial probe was used to measure complex permittivity of dielectric material ε = ε\´ + ε". The probe is basically a coaxial transmission line with an open end put into tight mechanical contact with the sample under test. Complex permittivity of the sample material was calculated from the coefficient of microwave reflection from the probe-sample interface. Using the probe the complex permittivity can be measured in a wide frequency range. Such broadband spectroscopy enables detection of foreign phase inclusions, delamination of dielectric layer and cracks on the ceramics/metal substrate interface, etc. Microwave probe enables noninvasive and nondestructive test of both small-area and large-area surfaces. Defects in the ceramic layer under test are revealed as anomalies of the dielectric permittivity on the background of almost constant ε, which is characteristic for the rest of the material.
  • Keywords
    aluminium alloys; chromium alloys; delamination; flaw detection; inclusions; microwave measurement; microwave reflectometry; nickel alloys; nondestructive testing; permittivity; permittivity measurement; superalloys; thermal barrier coatings; yttrium alloys; yttrium compounds; zirconium compounds; YSZ/MCrAlY/Ni-superalloy; broad band microwave probe; ceramics/metal substrate interface; coaxial transmission line; coefficient of microwave reflection; complex permittivity; cracks; delamination; dielectric coatings; foreign phase inclusions; nondestructive test; open-ended coaxial probe; thermal barrier coatings; tight mechanical contact; Ceramics; Coatings; Coaxial components; Dielectric materials; Dielectric measurements; Dielectric substrates; Nondestructive testing; Permittivity measurement; Probes; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-7414-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2002.1195878
  • Filename
    1195878