DocumentCode
3411798
Title
Broad band microwave probe for nondestructive test of dielectric coatings
Author
Grishin, A.M. ; Denysenkov, V.P.
Author_Institution
Dept. of Condensed Matter Phys., R. Inst. of Technol., Stockholm, Sweden
fYear
2002
fDate
28 May-1 June 2002
Firstpage
91
Lastpage
93
Abstract
We report on nondestructive characterization of Thermal Barrier Coatings (TBC: YSZ/MCrAlY/Ni-superalloy). To test TBC we have employed the method of electromagnetic defectoscopy. We have modernized this method by applying microwave probe instead of RF coil: an open-ended coaxial probe was used to measure complex permittivity of dielectric material ε = ε\´ + ε". The probe is basically a coaxial transmission line with an open end put into tight mechanical contact with the sample under test. Complex permittivity of the sample material was calculated from the coefficient of microwave reflection from the probe-sample interface. Using the probe the complex permittivity can be measured in a wide frequency range. Such broadband spectroscopy enables detection of foreign phase inclusions, delamination of dielectric layer and cracks on the ceramics/metal substrate interface, etc. Microwave probe enables noninvasive and nondestructive test of both small-area and large-area surfaces. Defects in the ceramic layer under test are revealed as anomalies of the dielectric permittivity on the background of almost constant ε, which is characteristic for the rest of the material.
Keywords
aluminium alloys; chromium alloys; delamination; flaw detection; inclusions; microwave measurement; microwave reflectometry; nickel alloys; nondestructive testing; permittivity; permittivity measurement; superalloys; thermal barrier coatings; yttrium alloys; yttrium compounds; zirconium compounds; YSZ/MCrAlY/Ni-superalloy; broad band microwave probe; ceramics/metal substrate interface; coaxial transmission line; coefficient of microwave reflection; complex permittivity; cracks; delamination; dielectric coatings; foreign phase inclusions; nondestructive test; open-ended coaxial probe; thermal barrier coatings; tight mechanical contact; Ceramics; Coatings; Coaxial components; Dielectric materials; Dielectric measurements; Dielectric substrates; Nondestructive testing; Permittivity measurement; Probes; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
ISSN
1099-4734
Print_ISBN
0-7803-7414-2
Type
conf
DOI
10.1109/ISAF.2002.1195878
Filename
1195878
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