Title :
A CMOS image sensor with reset level control using dynamic reset current source for noise suppression
Author :
Kwang-Hyun Lee ; Euisik Yoon
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., KAIST, Daejeon, South Korea
Abstract :
A 512 × 384 CMOS image sensor in 0.18μm 1P4M technology with 5.9μm pixel pitch and a dynamic reset current source to compensate for kTC reset noise and fixed pattern noise is presented. A total of 390μV(rms) readout noise, and a factor of two improvement over conventional reset is achieved. The chip operates at 1.8V and consumes 40mW excluding I/O and off-chip DAC for a single-slope ADC at 24frames/s.
Keywords :
CMOS image sensors; analogue-digital conversion; digital-analogue conversion; integrated circuit noise; low-power electronics; readout electronics; 1.8 V; 1P4M technology; 40 mW; CMOS image sensor; demonstration chip; dynamic reset current source; fixed pattern noise; noise suppression; readout noise; reset level control; single-slope ADC; subthreshold current; voltage fluctuation; CMOS image sensors; Capacitance; Charge transfer; Fault location; Level control; Noise level; Noise reduction; Partial discharges; Threshold voltage; Voltage control;
Conference_Titel :
Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International
Print_ISBN :
0-7803-8267-6
DOI :
10.1109/ISSCC.2004.1332620
