Title :
Combined linear-logarithmic CMOS image sensor
Author :
Hurwitz, J.E.D. ; Renshaw, D. ; Henderson, Robert K.
Abstract :
A 352×288 pixel array achieves >120 dB dynamic range through merging sequential linear and logarithmic images. Calibration is used to match offset and gain. A 7-transistor pixel is built in a 0.18 μm 1P4M CMOS process.
Keywords :
CMOS image sensors; calibration; image sequences; integrated circuit measurement; 0.18 micron; 101376 pixel; 288 pixel; 352 pixel; CMOS process; calibration; combined linear-logarithmic CMOS image sensor; dynamic range; offset-gain matching; pixel array; sequential linear and logarithmic image merging; seven-transistor pixel; CMOS image sensors; CMOS process; Calibration; Delay; Dynamic range; Image sensors; Pixel; Storms; Testing; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International
Print_ISBN :
0-7803-8267-6
DOI :
10.1109/ISSCC.2004.1332621
