DocumentCode
3411870
Title
Combined linear-logarithmic CMOS image sensor
Author
Hurwitz, J.E.D. ; Renshaw, D. ; Henderson, Robert K.
fYear
2004
fDate
15-19 Feb. 2004
Firstpage
116
Abstract
A 352×288 pixel array achieves >120 dB dynamic range through merging sequential linear and logarithmic images. Calibration is used to match offset and gain. A 7-transistor pixel is built in a 0.18 μm 1P4M CMOS process.
Keywords
CMOS image sensors; calibration; image sequences; integrated circuit measurement; 0.18 micron; 101376 pixel; 288 pixel; 352 pixel; CMOS process; calibration; combined linear-logarithmic CMOS image sensor; dynamic range; offset-gain matching; pixel array; sequential linear and logarithmic image merging; seven-transistor pixel; CMOS image sensors; CMOS process; Calibration; Delay; Dynamic range; Image sensors; Pixel; Storms; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International
ISSN
0193-6530
Print_ISBN
0-7803-8267-6
Type
conf
DOI
10.1109/ISSCC.2004.1332621
Filename
1332621
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