• DocumentCode
    34119
  • Title

    Experimental Control and Design of Low-Frequency Bias Networks for Dynamically Biased Amplifiers

  • Author

    Pelaz, Joana ; Collantes, Juan-Mari ; Otegi, Nerea ; Anakabe, Aitziber ; Collins, Gayle

  • Author_Institution
    Electr. & Electron. Dept., Univ. of the Basque Country (UPV/EHU), Bilbao, Spain
  • Volume
    63
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1923
  • Lastpage
    1936
  • Abstract
    To reach the video bandwidth requirements on the supply paths, power amplifiers with dynamic bias schemes are constrained to reduce the values of the low-frequency (LF) decoupling capacitors on their bias lines. This can entail a decrease of the LF stability margins, among other negative effects. In this work, a methodology is proposed to experimentally monitor and control the dominant poles that govern the LF dynamics of both gate and drain bias lines from dc to high compression power. A specific topology for the bias observation accesses allows a consistent characterization in large-signal regimes. An automatic procedure to trace root contours versus four control parameters is also developed. The complete approach can be used to optimize the design of the bias lines in terms of video bandwidth, relative stability margins, and bias voltage transfer function characteristics. Moreover, the design can account for the effect of the large-signal RF drive on these LF performances. The methodology is exemplified and validated in a demonstrator prototype specifically built for that purpose.
  • Keywords
    capacitors; circuit stability; frequency control; power amplifiers; transfer functions; LF decoupling capacitor; LF stability margin; bias voltage transfer function characteristics; dominant pole; drain bias line; dynamical biased amplifier; gate bias line; large-signal RF drive; low-frequency bias network; low-frequency decoupling capacitor; power amplifier; root contour tracking; video bandwidth requirement; Capacitors; Electrical resistance measurement; Frequency measurement; Ports (Computers); Prototypes; Radio frequency; Scattering parameters; Circuit stability; Floquet exponents; dynamic bias; identification; measurement; poles and zeros;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2015.2419213
  • Filename
    7089321