DocumentCode :
3411945
Title :
Scenario path identification for distributed systems: A graph based approach
Author :
Kanjilal, Ananya ; Sengupta, Sabnam ; Bhattacharya, Swapan
Author_Institution :
B.P. Poddar Inst. of Manage. & Technol., Kolkata, India
fYear :
2010
fDate :
8-11 June 2010
Firstpage :
1
Lastpage :
8
Abstract :
With increased complexity of software systems being developed; analysis of use case scenarios is gaining importance leading to effective test case identification during early part of the life cycle. Existing approaches provide various methods for analysis of UML activity diagrams and scenario path identification based on graph models of activity diagrams. In most cases these methods consider a single activity diagram. However use case scenarios may span multiple activity diagrams, which have become quite common with distributed development of software systems. In this paper we propose Activity Relationship graph model that depicts the interrelationship of activity diagrams modeling a use case. Activity Relationship graph ARG is a hierarchical graph where each node depicts an activity diagram modeled as activity diagram graph (AG). We also define a set of metrics named Use case Scenario Paths (USP) that measures the minimum number of independent paths in ARG. An algorithm is proposed to analyze ARG and derive the number of Use case Scenario Paths. This gives a measure of the number of test paths for a requirement based on analysis models early in the life cycle.
Keywords :
distributed processing; graph theory; object-oriented programming; program testing; software engineering; UML; activity relationship graph model; distributed system; life cycle test; path identification; software system complexity; use case scenario path; Algorithm design and analysis; Analytical models; Complexity theory; Measurement; Object oriented modeling; Software; Unified modeling language; Activity relationship graph; Graph based analysis; Graph based test path; Hierarchical graphs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Rapid System Prototyping (RSP), 2010 21st IEEE International Symposium on
Conference_Location :
Fairfax, VA
Print_ISBN :
978-1-4244-7073-0
Electronic_ISBN :
978-1-4244-7072-3
Type :
conf
DOI :
10.1109/RSP.2010.5656332
Filename :
5656332
Link To Document :
بازگشت