DocumentCode :
3412289
Title :
Loss tangent measurements of dielectric substrates from 15K to 300K with two resonators: investigation into accuracy issues
Author :
Mazierska, Janina ; Jacob, Mohan V. ; Ledenyov, Dimitri ; Krupk, J.
Author_Institution :
Inst. of Inf. Sci. & Technol., Massey Univ., New Zealand
Volume :
4
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880 and 6010.2, LaAlO3, LSAT, MgO and quartz) was measured at varying temperatures with two TE01δ dielectric resonators to ensure verification of the tests. Accuracy of the measurements has been investigated and discussed for a superconducting single post and a copper split post resonators in a temperature range from 15K to 300K.
Keywords :
copper; dielectric losses; dielectric resonators; lanthanum compounds; magnesium compounds; quartz; superconducting resonators; 15 to 300 K; LaAlO3; MgO; SiO2; copper split post resonator; dielectric resonators; loss tangent measurement; low loss dielectric substrates; medium loss dielectric substrates; superconducting single post resonator; very low loss dielectric substrates; Copper; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Loss measurement; Tellurium; Temperature distribution; Temperature measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606805
Filename :
1606805
Link To Document :
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