DocumentCode :
341231
Title :
Key comparisons of National Measurement Standards
Author :
Witt, Thomas J.
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
768
Abstract :
The mutual recognition of national measurement standards is of fundamental importance as a supporting member of a modern structure of international trade in goods and services. Calibration and testing services, accreditation bodies and users of these services must have confidence that the national measurement standards upon which their work is based are indeed equivalent. A set of key comparisons of national measurement standards is the technical basis for the mutual recognition agreement drawn up by the Comite International des Poids et Mesures (CIPM) and soon to be signed by the directors of nearly forty national metrology institutes (NMI). This presentation describes how the CIPM´s Consultative Committees (CC) choose key comparisons and how they are carried out by national metrology institutes or by the Bureau International des Poids et Mesures (BIPM). This can be done (1) under the auspices of the Consultative Committees, (2) under the auspices of regional metrology organization (RMO), or simply (3) as bilateral comparisons between two institutes; but always under a set of general guidelines. The presentation describes how key comparison results are discussed and examined by the Consultative Committees and how, after approval, they will be listed in a freely available key comparison database
Keywords :
measurement standards; BIPM; CIPM; comparison database; consultative committee; international trade; mutual recognition agreement; national measurement standard; national metrology institute; regional metrology organization; Accreditation; Calibration; Databases; Guidelines; Integrated circuit measurements; International trade; Laboratories; Measurement standards; Metrology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
ISSN :
1091-5281
Print_ISBN :
0-7803-5276-9
Type :
conf
DOI :
10.1109/IMTC.1999.776971
Filename :
776971
Link To Document :
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