• DocumentCode
    3412324
  • Title

    Effect of A-site substitution on the magnetic and dielectric behaviors of YMnO3 based ferroelectric thin films

  • Author

    Fujimura, N. ; Sakata, H. ; Ito, D. ; Yokota, T. ; Ito, T.

  • Author_Institution
    Dept. of Appl. Mater. Sci., Osaka Prefecture Univ., Japan
  • fYear
    2002
  • fDate
    28 May-1 June 2002
  • Firstpage
    219
  • Lastpage
    222
  • Abstract
    Dielectric and magnetic properties of A-site substituted YMnO3 ceramics and epitaxial films were studied. Stoichiometric polycrystalline bulk sample exhibit p-type conduction due to the existence of Mn4+. The I-V property is well explained the Pool-Frenkel type carrier emission, and the activation energy is calculated to be 0.38 eV. The carrier density decreases by Zr doping and increases by Li or Mg doping. Although all the samples exhibit antiferromagnetic magnetization behavior against the applied magnetic field at 5 K, carrier doped samples displays parasitic ferromagnetic behavior (weak ferromagnetism). Epitaxial films show distinct ferroelectric property and also exhibit antiferromagnetism. Substituting Y with Yb enhances the ferromagnetic interaction.
  • Keywords
    Poole-Frenkel effect; antiferromagnetic materials; carrier density; exchange interactions (electron); ferroelectric ceramics; ferroelectric thin films; magnetic thin films; magnetisation; weak ferromagnetism; yttrium compounds; 0.38 eV; 5 K; A-site substitution; I-V property; Pool-Frenkel type carrier emission; YMnO3; activation energy; antiferromagnetic magnetization; carrier density; ceramics; epitaxial films; ferroelectric thin films; ferromagnetic interaction; parasitic ferromagnetic behavior; weak ferromagnetism; Antiferromagnetic materials; Ceramics; Charge carrier density; Dielectrics; Doping; Magnetic fields; Magnetic films; Magnetic properties; Magnetization; Zirconium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-7414-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2002.1195909
  • Filename
    1195909