Title :
Maximum likelihood estimator for jitter noise models
Author :
Vandersteen, Gerd ; Pintelou, R.
Author_Institution :
Dept. ELEC., Vrije Univ., Brussels, Belgium
Abstract :
High frequency sampling scopes suffer from both additive noise and time jitter. The classical techniques for identifying the additive noise and time jitter noise are based on linear least squares estimators. This work derives the maximum likelihood estimator and compares it performance with the least squares estimator. Simulation results show the gain in efficiency of the proposed method under practical conditions of the sampling scopes
Keywords :
cathode-ray oscilloscopes; least squares approximations; maximum likelihood estimation; measurement errors; timing jitter; additive noise; high frequency sampling scopes; linear least squares estimators; maximum likelihood estimator; time jitter noise models; Additive noise; Jitter; Maximum likelihood detection; Maximum likelihood estimation; Newton method; Nonlinear equations; Sampling methods; Time measurement; Uncertainty;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776990
