• DocumentCode
    3412508
  • Title

    Dielectric properties of lead barium zirconate titanate-based relaxors for power electronics applications

  • Author

    Pan, Ming-Jen ; Rayne, Roy ; Bender, Barry

  • Author_Institution
    Nova Res. Inc., Alexandria, VA, USA
  • fYear
    2002
  • fDate
    28 May-1 June 2002
  • Firstpage
    255
  • Lastpage
    258
  • Abstract
    In this study, we examined the effects of niobium oxide and lanthanum oxide dopants on the dielectric properties of a lead barium zirconate titanate (PBZT) relaxor material. Specifically, our goal was to maximize PBZT´s dielectric constant (>6000) while maintaining its stability under DC electric field for filter capacitor applications. Our results showed that the Nb addition did not have a significant effect on the dielectric behavior of PBZT, except the 1% Nb addition which increased the PBZT´s dielectric constant by 17%. The cause of the increase is speculated in this article. On the other hand, the La addition caused a monotonic decrease of dielectric constant and a significant shift of the dielectric peaks toward low temperature.
  • Keywords
    barium compounds; ferroelectric capacitors; ferroelectric materials; lead compounds; permittivity; relaxor ferroelectrics; (Pb0.65Ba0.35)(Zr0.70Ti0.30)O3; PBZT´s dielectric constant; PZT:Ba; PbZrO3TiO3:Ba; dielectric properties; filter capacitor applications; lead barium zirconate titanate-based relaxors; power electronics applications; Barium; Dielectric constant; Dielectric materials; Filters; Lanthanum; Lead compounds; Niobium; Power electronics; Power system stability; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-7414-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2002.1195918
  • Filename
    1195918