DocumentCode :
341266
Title :
On the application of special self-calibration algorithm to improve impedance measurement by standard measuring systems
Author :
Liu, Ji-Gou ; Frühauf, Uwe ; Schonecker, Andreas
Author_Institution :
Fac. of Electr. Eng., Tech. Univ. Dresden, Germany
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
1017
Abstract :
In this paper self-calibration measuring methods are introduced to improve the accuracy of impedance measuring systems composed of standard instruments. Reference resistors are used for the self-calibration of measuring systems. The random errors are reduced by data processing using averaging and smoothing. The systematic errors are self-corrected by special self-calibration algorithms. These methods are applied to the impedance measurements of electrical elements and systems and the characterization of dielectric materials under high field intensities. Analysis and measurement results show an accuracy improvement compared with the measuring systems without self-calibration. Using the self-calibration methods precise impedance measurements are realizable in the measuring systems of lower accuracy and lower product cost
Keywords :
calibration; computerised instrumentation; electric impedance measurement; error correction; interpolation; measurement errors; measurement systems; resistors; accuracy improvement; averaging; data processing; dielectric materials; high field intensities; impedance measurement; interpolation; precision software; reduced random errors; reference resistors; sampling data; self-calibration algorithm; self-correction; smoothing; standard measuring systems; systematic errors; uncertainty; Calibration; Data processing; Dielectric measurements; Electric variables measurement; Error correction; Impedance measurement; Instruments; Measurement standards; Resistors; Signal processing algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
ISSN :
1091-5281
Print_ISBN :
0-7803-5276-9
Type :
conf
DOI :
10.1109/IMTC.1999.777014
Filename :
777014
Link To Document :
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