• DocumentCode
    341266
  • Title

    On the application of special self-calibration algorithm to improve impedance measurement by standard measuring systems

  • Author

    Liu, Ji-Gou ; Frühauf, Uwe ; Schonecker, Andreas

  • Author_Institution
    Fac. of Electr. Eng., Tech. Univ. Dresden, Germany
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1017
  • Abstract
    In this paper self-calibration measuring methods are introduced to improve the accuracy of impedance measuring systems composed of standard instruments. Reference resistors are used for the self-calibration of measuring systems. The random errors are reduced by data processing using averaging and smoothing. The systematic errors are self-corrected by special self-calibration algorithms. These methods are applied to the impedance measurements of electrical elements and systems and the characterization of dielectric materials under high field intensities. Analysis and measurement results show an accuracy improvement compared with the measuring systems without self-calibration. Using the self-calibration methods precise impedance measurements are realizable in the measuring systems of lower accuracy and lower product cost
  • Keywords
    calibration; computerised instrumentation; electric impedance measurement; error correction; interpolation; measurement errors; measurement systems; resistors; accuracy improvement; averaging; data processing; dielectric materials; high field intensities; impedance measurement; interpolation; precision software; reduced random errors; reference resistors; sampling data; self-calibration algorithm; self-correction; smoothing; standard measuring systems; systematic errors; uncertainty; Calibration; Data processing; Dielectric measurements; Electric variables measurement; Error correction; Impedance measurement; Instruments; Measurement standards; Resistors; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.777014
  • Filename
    777014