DocumentCode
341266
Title
On the application of special self-calibration algorithm to improve impedance measurement by standard measuring systems
Author
Liu, Ji-Gou ; Frühauf, Uwe ; Schonecker, Andreas
Author_Institution
Fac. of Electr. Eng., Tech. Univ. Dresden, Germany
Volume
2
fYear
1999
fDate
1999
Firstpage
1017
Abstract
In this paper self-calibration measuring methods are introduced to improve the accuracy of impedance measuring systems composed of standard instruments. Reference resistors are used for the self-calibration of measuring systems. The random errors are reduced by data processing using averaging and smoothing. The systematic errors are self-corrected by special self-calibration algorithms. These methods are applied to the impedance measurements of electrical elements and systems and the characterization of dielectric materials under high field intensities. Analysis and measurement results show an accuracy improvement compared with the measuring systems without self-calibration. Using the self-calibration methods precise impedance measurements are realizable in the measuring systems of lower accuracy and lower product cost
Keywords
calibration; computerised instrumentation; electric impedance measurement; error correction; interpolation; measurement errors; measurement systems; resistors; accuracy improvement; averaging; data processing; dielectric materials; high field intensities; impedance measurement; interpolation; precision software; reduced random errors; reference resistors; sampling data; self-calibration algorithm; self-correction; smoothing; standard measuring systems; systematic errors; uncertainty; Calibration; Data processing; Dielectric measurements; Electric variables measurement; Error correction; Impedance measurement; Instruments; Measurement standards; Resistors; Signal processing algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location
Venice
ISSN
1091-5281
Print_ISBN
0-7803-5276-9
Type
conf
DOI
10.1109/IMTC.1999.777014
Filename
777014
Link To Document