• DocumentCode
    3412718
  • Title

    Piezoelectric properties and structural characterization of (Na,Bi)Bi2Ta2O9 ceramics with bismuth layer-structure

  • Author

    Aoyagi, R. ; Matsushita, M. ; Komagata, K. ; Takeda, H. ; Okamura, S. ; Shiosaki, T.

  • Author_Institution
    Graduate Sch. of Mater. Sci., Nara Inst. of Sci. & Technol., Japan
  • fYear
    2002
  • fDate
    28 May-1 June 2002
  • Firstpage
    311
  • Lastpage
    314
  • Abstract
    The piezoelectric properties of bismuth layer-structured ferroelectrics Na0.5-xBi0.5+x3/Bi2Ta2O9 (NBT(x)) dense ceramics were investigated, and the crystal structure of synthesized NBT(x) powders was analyzed by the Rietveld method. NBT(x) powder and ceramics were prepared by conventional synthesis method. NBT(x) powder for x = 0 and x = 0.1 was confirmed to be single phase of BLSFs (m = 2) by x-ray diffraction method. The electromechanical coupling coefficients kp of NBT(x = 0) and NBT(x = 0.1) dense ceramics were 10% and 8.3%, respectively. The kp of NBT(x = 0) was one of the largest in reported non-oriented BLSFs ceramics.
  • Keywords
    X-ray diffraction; bismuth compounds; crystal structure; dielectric losses; dielectric polarisation; ferroelectric Curie temperature; ferroelectric ceramics; lattice constants; permittivity; piezoceramics; powder technology; sodium compounds; (NaBi)Bi2Ta2O9; Curie temperature; Rietveld method; bismuth layer-structured ferroelectrics; crystal structure; dense ceramics; dielectric constant; electrical resistivity; electromechanical coupling coefficients; lattice parameters; phase identification; piezoelectric properties; poled ceramics; single phase; tangential loss factor; temperature dependence; x-ray diffraction; Bismuth; Ceramics; Dielectric measurements; Electric resistance; Electric variables measurement; Electrical resistance measurement; Ferroelectric materials; Nonvolatile memory; Powders; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-7414-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2002.1195931
  • Filename
    1195931