Title :
Compiled-code VHDL approximate fault simulation
Author :
Ryan, Christopher A. ; Tront, Joseph G.
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
Switch-level faults, as opposed to traditional gate-level faults, can more accurately model physical failures found in an integrated circuit. However, one problem with switch-level fault simulation is that of long simulation times. This paper addresses this problem by performing fast approximate switch-level fault simulation using transistor reverse level ordering, and a novel 9-valued switch-level extension to observability. The probability of propagation of a fault from an arbitrary line of the switch-level circuit to the primary output is shown to be a function of the average node fan-in and the line´s distance to primary output. Using this probability, results show one order of magnitude of complexity speed-up as compared to traditional fault simulation techniques, while maintaining good accuracy
Keywords :
circuit analysis computing; fault diagnosis; hardware description languages; integrated circuit modelling; logic testing; compiled-code VHDL approximation; complexity; failures; fault simulation; integrated circuit; multivalued observability; node fan-in; probability; switch-level faults; transistor reverse level ordering; Circuit faults; Circuit simulation; Integrated circuit modeling; Mathematical model; Matrix converters; Observability; Switches; Switching circuits; Testing; Voltage control;
Conference_Titel :
ASIC Conference and Exhibit, 1995., Proceedings of the Eighth Annual IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2707-1
DOI :
10.1109/ASIC.1995.580691