• DocumentCode
    3412898
  • Title

    New coupled EM and circuit simulation flow for integrated spiral inductor by introducing symbolic simplified expressions

  • Author

    Ciccazzo, Angelo ; Halfmann, Thomas ; Marotta, Angelo ; Nicosia, Giuseppe ; Rinaudo, Salvatore ; Stracquadanio, Giovanni ; Venturi, Alberto

  • Author_Institution
    ST Microelectron., Catania
  • fYear
    2008
  • fDate
    June 30 2008-July 2 2008
  • Firstpage
    1203
  • Lastpage
    1208
  • Abstract
    Micro-electronics component and circuit design requires long computation time; to reduce this time, the use of simplification techniques has been introduced. In order to obtain a first validation of the method, a first test case is presented; the simplification techniques have been applied to the analytical expression of Y parameters of an inductor equivalent circuit. The resulting expressions have been used in the fitting process in order to reproduce the behaviour of a simulated inductor. Five different optimization algorithms, both deterministic (POWELL and DIRECT) and stochastic (CRS, CRS ENHANCED and OPTIA) have been tested for the fitting. The result of the introduction of the simplification techniques has been the reduction of the running time during the fitting. From an optimization point of view, the best results have been obtained by the stochastic algorithms CRS, and OPTIA.
  • Keywords
    circuit simulation; equivalent circuits; fitting (assembly); inductors; circuit simulation flow; fitting process; inductor equivalent circuit; integrated spiral inductor; micro-electronics component; symbolic simplified expressions; Circuit simulation; Circuit testing; Coupling circuits; Inductors; Integrated circuit modeling; Optimized production technology; Radio frequency; Spirals; Stochastic processes; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
  • Conference_Location
    Cambridge
  • Print_ISBN
    978-1-4244-1665-3
  • Electronic_ISBN
    978-1-4244-1666-0
  • Type

    conf

  • DOI
    10.1109/ISIE.2008.4677177
  • Filename
    4677177