DocumentCode :
3412971
Title :
Timing analysis models for gates and cells with bipolar-transistor output stages
Author :
Tesu, Ion-Constantin ; Pileggi, Lawrence T.
Author_Institution :
Fac. of Electron. & Telecommun., Iasi Univ., Romania
fYear :
1995
fDate :
18-22 Sep 1995
Firstpage :
149
Lastpage :
152
Abstract :
A simple and efficient modeling technique for logic gates and cells with bipolar output stages is described. It permits the analysis of the gate and associated interconnect response waveforms, including the RC loading effects on the gate. The model decouples the gate problem into an intrinsic delay and a gate output impedance model which drives the RC load. The gate output impedance is modeled by a passive, linear, RLC circuit with the parameters specified as a function of an effective capacitance loading. Importantly, this output impedance model is shown to capture the oscillatory nature of emitter-follower output stages for BiCMOS and ECL gates. The passive nature of this impedance model makes it ideal for simulating the subsequent interconnect transient response using a model order reduction method such as moment matching
Keywords :
BiCMOS logic circuits; bipolar logic circuits; emitter-coupled logic; integrated circuit modelling; logic gates; timing; BiCMOS gates; ECL gates; RC load; bipolar-transistor output stages; capacitance load; emitter-follower output stages; interconnect response waveform; intrinsic delay; logic cells; logic gates; model order reduction method; moment matching; output impedance model; passive linear RLC circuit; simulation; timing analysis; BiCMOS integrated circuits; Bipolar transistors; Capacitance; Circuit simulation; Delay; Impedance; Integrated circuit interconnections; Logic gates; RLC circuits; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC Conference and Exhibit, 1995., Proceedings of the Eighth Annual IEEE International
Conference_Location :
Austin, TX
ISSN :
1063-0988
Print_ISBN :
0-7803-2707-1
Type :
conf
DOI :
10.1109/ASIC.1995.580702
Filename :
580702
Link To Document :
بازگشت