DocumentCode
3413019
Title
Dielectric, elastic and piezoelectric losses of PZT ceramics in the resonance state
Author
Tsurumi, T. ; Kakemoto, H. ; Wada, S.
Author_Institution
Dept. of Metall. & Ceramics Sci., Tokyo Inst. of Technol., Japan
fYear
2002
fDate
28 May-1 June 2002
Firstpage
375
Lastpage
378
Abstract
The material coefficients of "soft"- and "hard"-PZTs were determined as complex values by the non-linear least-squares-fitting of immittance data measured for length-extensional bar resonators. The piezoelectric d-constant should be a complex value to obtain a best fitting between observed and calculated results. As the elastic, dielectric and piezoelectric losses determined in this process were not "intrinsic" losses, calculation process to evaluate the "intrinsic" losses was proposed. It was confirmed that the intrinsic losses were smaller than the corresponding extrinsic losses. The intrinsic piezoelectric loss existed in both soft- and hard-PZTs. About 50% of the loss of piezoelectric d-constant was derived from the elastic and dielectric losses. Most notable difference between the soft- and hard-PZTs were observed in their elastic losses.
Keywords
crystal resonators; dielectric losses; elastic constants; lead compounds; least squares approximations; permittivity; piezoceramics; PZT; PZT ceramics; Pb(Zr0.45Ti0.55)O3-Pb(Sb0.5Nb0.5)O3-MnO3; Pb(Zr0.52Ti0.48)O3-Nb2O5; PbZrO3TiO3; PbZrO3TiO3-Nb2O5; PbZrO3TiO3-PbSbO3NbO3-MnO3; complex value; complex values; dielectric losses; elastic losses; extrinsic losses; hard-PZT; immittance data; intrinsic losses; length-extensional bar resonators; material coefficients; nonlinear least-squares-fitting; piezoelectric d-constant; piezoelectric losses; resonance state; soft-PZT; Admittance; Ceramics; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Loss measurement; Piezoelectric materials; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
ISSN
1099-4734
Print_ISBN
0-7803-7414-2
Type
conf
DOI
10.1109/ISAF.2002.1195947
Filename
1195947
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