DocumentCode :
3413069
Title :
Critical issues in single crystal growth of PMN-PT by seeded polycrystal conversion
Author :
Chan, H.M. ; Harmer, M.P. ; Gorzkowski, E.P. ; King, P.T. ; Scotch, A.M. ; Rockosi, D.J.
Author_Institution :
Mater. Res. Center, Lehigh Univ., Bethlehem, PA, USA
fYear :
2002
fDate :
28 May-1 June 2002
Firstpage :
383
Lastpage :
388
Abstract :
Pb(Mg13/Nb23/)O3-35mol%PbTiO3 [PMN-35PT] single crystals have been produced via the Seeded Polycrystal Conversion process by embedding a seed crystal in a polycrystalline ceramic matrix, and inducing the single crystal boundary to migrate at the expense of the smaller matrix grains. Maintaining single crystal growth until full conversion of the polycrystal can only be achieved with an improved fundamental understanding of the factors that influence the migrating boundary. The present work addresses, in particular, the roles of liquid phase content and chemistry, sintering atmosphere, and defects such as twin boundaries. Characterization of the liquid film thickness and composition at key interfaces during the firing/growth cycle are discussed. Implications regarding the effect of PbO content on single crystal growth mechanisms are also presented.
Keywords :
crystal growth from melt; ferroelectric materials; lead compounds; sintering; twin boundaries; PMN-PT; PMN-PbTiO3; Pb(Mg13/Nb23/)O3-35mol%PbTiO3; PbMgO3NbO3-PbTiO3; chemistry; firing/growth cycle; liquid film thickness; liquid phase content; seed crystal embedding in polycrystalline ceramic matrix; seeded polycrystal conversion; single crystal boundary; single crystal growth; sintering atmosphere; smaller matrix grains; twin boundaries; Annealing; Atmosphere; Capacitive sensors; Ceramics; Chemistry; Crystalline materials; Crystals; Ferroelectric films; Ferroelectric materials; Grain size;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
ISSN :
1099-4734
Print_ISBN :
0-7803-7414-2
Type :
conf
DOI :
10.1109/ISAF.2002.1195949
Filename :
1195949
Link To Document :
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