• DocumentCode
    341326
  • Title

    A fully integrated CMOS magnetic current monitor

  • Author

    Malcovati, Piero ; Maloberti, Franco

  • Author_Institution
    Dept. of Electr. Eng., Pavia Univ., Italy
  • Volume
    5
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    128
  • Abstract
    In this paper we present a fully-integrated magnetic current monitor, which allows accurate and non-invasive current measurements in industrial apparatus. The magnetic field generated by the current to be measured is sensed by a Hall device, amplified, converted into the digital domain with 9 bits of resolution and delivered to an on-board I 2S serial interface. The voltage amplifier provides digitally programmable gain and offset. On-chip Zener-tapping circuits are used as PROM to store the gain and offset calibration words. Two different operating ranges (20 A and 200 A full scale) are available with independent calibration coefficients. A prototype of the complete microsystem has been integrated in a conventional 0.8 μm CMOS process. Experimental results are presented
  • Keywords
    CMOS integrated circuits; Hall effect transducers; calibration; electric current measurement; magnetic sensors; mixed analogue-digital integrated circuits; monitoring; 0.8 micron; 20 A; 200 A; 256 kHz; 5 V; ASIC; CMOS magnetic current monitor; Hall device; PROM; calibration words storage; digitally programmable gain; digitally programmable offset; fully-integrated current monitor; gain calibration words; independent calibration coefficients; industrial apparatus; noninvasive current measurements; offset calibration words; onboard I2S serial interface; onchip Zener-tapping circuits; voltage amplifier; CMOS process; Calibration; Current measurement; Integrated circuit measurements; Magnetic domains; Magnetic field measurement; Monitoring; PROM; Prototypes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5471-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1999.777527
  • Filename
    777527