• DocumentCode
    3413521
  • Title

    Fine grain analysis of simulators accuracy for calibrating performance models

  • Author

    Lattuada, Marco ; Ferrandi, Fabrizio

  • Author_Institution
    Dipartimiento di Elettron. ed Inf., Politec. di Milano, Milano, Italy
  • fYear
    2010
  • fDate
    8-11 June 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In embedded system design, the tuning and validation of a cycle accurate simulator is a difficult task. The designer has to assure that the estimation error of the simulator meets the design constraints on every application. If an application is not correctly estimated, the designer has to identify on which parts of the application the simulator introduces an estimation error and consequently fix the simulator. However, detecting which are the mispredicted parts of a very large application can be a difficult process which requires a lot of time. In this paper we propose a methodology which helps the designer to fast and automatically isolate the portions of the application mispredicted by a simulator. This is accomplished by recursively analyzing the application source code trace highlighting the mispredicted sections of source code. The results obtained applying the methodology to the TSIM simulator show how our methodology is able to fast analyze large applications isolating small portions of mispredicted code.
  • Keywords
    embedded systems; iterative methods; multiprocessing systems; performance evaluation; recursive estimation; source coding; TSIM simulator; code misprediction; cycle accurate simulator; embedded system design; estimation error; fine grain analysis; performance model calibration; source code trace; Accuracy; Analytical models; Computational modeling; Estimation error; Instruments; Mathematical model; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Rapid System Prototyping (RSP), 2010 21st IEEE International Symposium on
  • Conference_Location
    Fairfax, VA
  • Print_ISBN
    978-1-4244-7073-0
  • Electronic_ISBN
    978-1-4244-7072-3
  • Type

    conf

  • DOI
    10.1109/RSP.2010.5656414
  • Filename
    5656414