Title :
Longitudinal mode control in Fabry-Perot lasers
Author :
Kozlowski, D.A. ; Young, J.S. ; England, J.M.C. ; Plumb, R.G.S.
Author_Institution :
Dept. of Eng., Cambridge Univ., UK
Abstract :
Localised reflections within the lasing filament of Fabry-Perot lasers cause spectral perturbations. Focused Ga+ ion beam etching can be used to form steep walled pits of submicron size in the lasing filament which give rise to localised reflections with minimal rises in threshold current. Control of both position and depth enables one to sculpture the modal envelope so as to form singlemode Fabry-Perot lasers with 30 dB of mode suppression, temperature stable over 30°C with an increase in threshold of a few milliamps. Modelling results show an effective reflectivity can be allocated to the etched pit and this is an order of magnitude below the cleaved facet reflectivity
Keywords :
focused ion beam technology; laser modes; laser stability; laser transitions; light scattering; optical communication equipment; optical fabrication; reflectivity; semiconductor lasers; sputter etching; waveguide lasers; 1.3 micron; Fabry-Perot lasers; Ga; effective reflectivity; focused Ga+ ion beam etching; lasing filament; localised reflections; longitudinal mode control; modal envelope; modelling; single-mode lasers; steep walled pits; temperature stability; Etching; Fabry-Perot; Ion beams; Laser modes; Laser stability; Optical control; Optical reflection; Reflectivity; Temperature control; Threshold current;
Conference_Titel :
High Performance Electron Devices for Microwave and Optoelectronic Applications, 1995. EDMO., IEEE 1995 Workshop on
Conference_Location :
London
Print_ISBN :
0-7803-2537-0
DOI :
10.1109/EDMO.1995.493700
