Title :
Embedded cores using built-in mechanisms
Author :
Kagaris, Dimitri ; Tragoudas, Spyros
Author_Institution :
Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
Abstract :
We present a new framework for designing easily testable cores. The method is based on the identification of disjoint core components (CCs), for which no implementation details are released. Netlist information is provided for the remaining portion of the core. The CCs must guarantee that the predesigned intellectual property of the core is protected and that the testing process is simplified. Currently we only consider stuck-at faults. In this work we analyze the attributes of each CC, their position in the core, and then give a CAD tool that generates the set of CCs within the core and recommends the type of built-in test mechanism for each CC
Keywords :
application specific integrated circuits; automatic test pattern generation; built-in self test; embedded systems; fault diagnosis; industrial property; logic testing; CAD tool; built-in mechanisms; disjoint core components; embedded cores; intellectual property; netlist information; stuck-at faults; Application specific integrated circuits; Automatic testing; Built-in self-test; Carbon capture and storage; Design automation; Electrocardiography; Hardware; Intellectual property; Protection; Shift registers;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.777796
