Title :
Statistical characterization and modeling of analog functional blocks
Author :
Qu, Ming ; Styblinski, M.A.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fDate :
30 May-2 Jun 1994
Abstract :
A methodology for statistical characterization and modeling of analog functional blocks, including inter-block and intra-block correlations is presented in this paper. The functional blocks are statistically characterized in the proposed model by a small number of postulated random variables. The related model parameter extraction is described. An OTA-C filter is used to demonstrate the proposed modeling method. Very good agreement with the Monte Carlo circuit analysis was obtained
Keywords :
active filters; analogue integrated circuits; circuit analysis computing; circuit optimisation; integrated circuit noise; integrated circuit yield; statistical analysis; OTA-C filter; analog functional blocks; circuit simulators; inter-block correlations; intra-block correlations; model parameter extraction; postulated random variables; statistical characterization; statistical modeling; yield optimisation; Analog integrated circuits; Circuit analysis; Circuit simulation; Circuit synthesis; Filters; Gaussian distribution; Integrated circuit noise; Parameter extraction; Random variables; Semiconductor device modeling;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.408770
