DocumentCode :
3414321
Title :
Spatio-temporal phase-encoding profilometry using correlation image sensor
Author :
Ando, Shigeru ; Ono, Nobutaka
Author_Institution :
Dept. of Inf. Phys. & Comput., Univ. of Tokyo, Tokyo
fYear :
2008
fDate :
June 30 2008-July 2 2008
Firstpage :
786
Lastpage :
791
Abstract :
In this paper, we propose a real-time 3D shape measurement system which consists of 1) a moving fringe projector for spatio-temporal encoding (single frequency in time but different phase in space) of illumination angle, and 2) the three-phase correlation image sensor (3PCIS) which performs the synchronous detection and amplitude/phase demodulation of intensity-modulated light in real time on each pixel. The 3PCIS demodulates amplitude and phase of moving fringes in a scene frame by frame. Then, it is unwrapped in real-time to a sequence of projection angle maps based on an efficient use of spatial and temporal continuity of the phase maps. Compared with the phase-shift method using a color image sensor or a high speed camera, the system is shown to have novel characteristics; pixel by pixel capture of phase map in a single frame, freedom from environmental light sources and grayness nonlinearity of fringes, reduced sensitivity to object motion, etc. We implemented this system using CMOS 200times200 and 320times256 pixel 3PCIS recently developed by us.
Keywords :
amplitude modulation; correlation methods; image coding; image colour analysis; image sensors; optical projectors; phase modulation; real-time systems; shape measurement; 3D shape measurement system; amplitude/phase demodulation; color image sensor; intensity-modulated light; moving fringe projector; projection angle map; real-time system; spatio-temporal phase-encoding profilometry; synchronous detection; three-phase correlation image sensor; Extraterrestrial measurements; Frequency; Image coding; Image sensors; Lighting; Performance evaluation; Phase detection; Pixel; Real time systems; Shape measurement; 3-D measurement; correlation image sensor; moire; phase shift; phase unwrapping; quadrature detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
Conference_Location :
Cambridge
Print_ISBN :
978-1-4244-1665-3
Electronic_ISBN :
978-1-4244-1666-0
Type :
conf
DOI :
10.1109/ISIE.2008.4677260
Filename :
4677260
Link To Document :
بازگشت