DocumentCode :
3415338
Title :
A Field Uniformity Study of a TEM Cell by Using a Short Wire Scatterer
Author :
Morioka, Takehiro
Author_Institution :
Nat. Inst., Tsukuba
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
1
Lastpage :
5
Abstract :
TEM cells are widely used for EMC/EMI measurements. However, the electric field strength only at the center point of the cell is roughly estimated. By introducing a passive scatterer into the cell, such as a straight wire, the echo fields can be detected by the deviation of the reflection coefficient from that of the empty cell. This deviation is related to the incident electric field at the location of the scatterer. In this paper, the electric field uniformity of a TEM cell for the dominant and orthogonal polarizations is investigated by the measurement.
Keywords :
TEM cells; electric field measurement; electromagnetic compatibility; electromagnetic interference; electromagnetic wave polarisation; electromagnetic wave scattering; EMC-EMI measurements; TEM cells; dominant polarizations; electric field strength; electric field uniformity; orthogonal polarizations; short wire scatterer; Antenna measurements; Dipole antennas; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Electromagnetic scattering; NIST; Probes; TEM cells; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
Type :
conf
DOI :
10.1109/ISEMC.2007.14
Filename :
4305594
Link To Document :
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