A Field Uniformity Study of a TEM Cell by Using a Short Wire Scatterer

Author

Morioka, Takehiro

Author_Institution

Nat. Inst., Tsukuba

fYear

2007

fDate

9-13 July 2007

Firstpage

1

Lastpage

5

Abstract

TEM cells are widely used for EMC/EMI measurements. However, the electric field strength only at the center point of the cell is roughly estimated. By introducing a passive scatterer into the cell, such as a straight wire, the echo fields can be detected by the deviation of the reflection coefficient from that of the empty cell. This deviation is related to the incident electric field at the location of the scatterer. In this paper, the electric field uniformity of a TEM cell for the dominant and orthogonal polarizations is investigated by the measurement.

Keywords

TEM cells; electric field measurement; electromagnetic compatibility; electromagnetic interference; electromagnetic wave polarisation; electromagnetic wave scattering; EMC-EMI measurements; TEM cells; dominant polarizations; electric field strength; electric field uniformity; orthogonal polarizations; short wire scatterer; Antenna measurements; Dipole antennas; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Electromagnetic scattering; NIST; Probes; TEM cells; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on

Conference_Location

Honolulu, HI

Print_ISBN

1-4244-1349-4

Electronic_ISBN

1-4244-1350-8

Type

conf

DOI

10.1109/ISEMC.2007.14

Filename

4305594