Title :
An inverse technique for dielectric-property determination from reflection measurement in spatial domain
Author :
Mearnchu, J. ; Torrungrueng, D. ; Phongcharoenpanich, C. ; Krairiksh, M.
Author_Institution :
Fac. of Eng. & Res. Center for Commun. & Inf. Technol., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
Abstract :
An inverse technique by reflection measurement in spatial domain is proposed instead of frequency domain. A steepest descent algorithm is used for minimizing performance functions to obtain fast convergence. Comparison results of inverse technique in spatial domain provides good agreement to those obtained from frequency domain ones that shows the possibility to design a low cost dielectric-property determination system.
Keywords :
dielectric properties; electromagnetic wave reflection; dielectric-property determination; frequency domain; inverse technique; reflection measurement; spatial domain; steepest descent algorithm; Antenna measurements; Costs; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency domain analysis; Frequency measurement; Microstrip antenna arrays; Reflection; Wideband;
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
DOI :
10.1109/APMC.2005.1606993
