DocumentCode :
3415920
Title :
Ultrasonic Study Of The Narrow-Gap Semiconductor PbTeS At Low Temperatures
Author :
Nikiforov, V.N. ; Vasil´ev, A.N. ; Romcevic, N.
Author_Institution :
Low Temperature Laboratory
fYear :
1994
fDate :
17-23 May 1994
Keywords :
Acoustic measurements; Electromagnetic measurements; Laboratories; Magnetic field measurement; Performance evaluation; Temperature dependence; Temperature measurement; Ultrasonic imaging; Ultrasonic variables measurement; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Surface Waves in Solid and Layered Structures, 1994, and National Conference on Acoustoelectronics. 1994 International Symposium on. Program and Abstracts
Conference_Location :
Moscow, Russia
Type :
conf
DOI :
10.1109/ISSWAS.1994.662458
Filename :
662458
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3415920
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