Causal Modeling and Extraction of Dielectric Constant and Loss Tangent for Thin Dielectrics

New dielectric materials are being used for reducing electromagnetic interference (EMI) and improving signal integrity (SI). Examples include using high dielectric constant materials for decoupling and thin dielectrics for managing return currents. As the frequency of the signals being propagated through such materials increases, the frequency dependent material properties become very important. We present a method to extract the frequency-dependent dielectric constant and loss tangent of such materials using rectangular power/ground planes. We have also developed a rapid plane solver for fast extraction of material properties and a causal modeling methodology based on the vector fitting algorithm.