Title :
A method for on-wafer S-parameter measurement of a differential amplifier by using two-port network analyzer
Author :
Sun, Ling ; Wang, Zhigong ; Gao, Jianjun
Author_Institution :
Inst. of RF- & OE-ICs, Southeast Univ., Nanjing, China
Abstract :
By analyzing the relationship of S-parameter between two-port differential and four-port single-ended networks, a method is found for measuring the S-parameter of a differential amplifier on wafer by using a normal two-port vector network analyzer. With this method, it should not especially purchase a four-port vector network analyzer. Furthermore, the method was also suitable for measuring S-parameter of any multi-port circuit by using two-ports measurement set.
Keywords :
S-parameters; differential amplifiers; matrix algebra; network analysers; two-port networks; differential amplifiers; four-port single-ended networks; on-wafer S-parameter measurement; two-port differential networks; two-port measurement set; two-port vector network analyzer; Circuits; Differential amplifiers; Measurement standards; Microwave measurements; Probes; Radio frequency; Scattering parameters; Semiconductor device measurement; Software measurement; Sun; ADS software; S-parameter measurement; differential amplifier;
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
DOI :
10.1109/APMC.2005.1607003
