A method for on-wafer S-parameter measurement of a differential amplifier by using two-port network analyzer

Author

Sun, Ling ; Wang, Zhigong ; Gao, Jianjun

Author_Institution

Inst. of RF- & OE-ICs, Southeast Univ., Nanjing, China

Volume

5

fYear

2005

fDate

4-7 Dec. 2005

Abstract

By analyzing the relationship of S-parameter between two-port differential and four-port single-ended networks, a method is found for measuring the S-parameter of a differential amplifier on wafer by using a normal two-port vector network analyzer. With this method, it should not especially purchase a four-port vector network analyzer. Furthermore, the method was also suitable for measuring S-parameter of any multi-port circuit by using two-ports measurement set.

Keywords

S-parameters; differential amplifiers; matrix algebra; network analysers; two-port networks; differential amplifiers; four-port single-ended networks; on-wafer S-parameter measurement; two-port differential networks; two-port measurement set; two-port vector network analyzer; Circuits; Differential amplifiers; Measurement standards; Microwave measurements; Probes; Radio frequency; Scattering parameters; Semiconductor device measurement; Software measurement; Sun; ADS software; S-parameter measurement; differential amplifier;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings

Print_ISBN

0-7803-9433-X

Type

conf

DOI

10.1109/APMC.2005.1607003

Filename

1607003