DocumentCode :
3416068
Title :
A Region Based Pan Sharpening Method Using Match Measure and Fuzzy Logic
Author :
Zaveri, Tanish ; Zaveri, Mukesh ; Makwana, Ishit ; Panchal, Mitul ; Sheth, Vitrag
Author_Institution :
Electron. & Commun. Eng. Dept., Nirma Univ. Inst. of Technol., Ahmedabad, India
fYear :
2009
fDate :
18-20 Dec. 2009
Firstpage :
1
Lastpage :
4
Abstract :
The proposed method provides novel tradeoff solution to preserve spectral as well as spatial quality using fuzzy logic. It combines match measure, region based approach and fuzzy logic to produce quality pan sharp image. Standard pan-sharpening methods do not allow control of the spatial and spectral quality of the pan sharp image. Sugeno integral fuzzy logic model allows us to blend the benefits of match measure and region based segmentation in the final fused image. The simulation results of our proposed algorithm preserves more detailed spatial and spectral information and better visual quality compared to earlier reported methods. The simulations results are also compared with standard and recently proposed multispectral image fusion techniques.
Keywords :
fuzzy logic; image fusion; image matching; image segmentation; integral equations; Sugeno integral fuzzy logic; image segmentation; match measure; multispectral image fusion; quality pan sharp image; region based pan sharpening; region based segmentation; spatial quality; spectral quality; visual quality; Energy measurement; Fuzzy logic; Fuzzy systems; Image fusion; Image segmentation; Multispectral imaging; Partitioning algorithms; Principal component analysis; Road transportation; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
India Conference (INDICON), 2009 Annual IEEE
Conference_Location :
Gujarat
Print_ISBN :
978-1-4244-4858-6
Electronic_ISBN :
978-1-4244-4859-3
Type :
conf
DOI :
10.1109/INDCON.2009.5409488
Filename :
5409488
Link To Document :
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