DocumentCode
3416068
Title
A Region Based Pan Sharpening Method Using Match Measure and Fuzzy Logic
Author
Zaveri, Tanish ; Zaveri, Mukesh ; Makwana, Ishit ; Panchal, Mitul ; Sheth, Vitrag
Author_Institution
Electron. & Commun. Eng. Dept., Nirma Univ. Inst. of Technol., Ahmedabad, India
fYear
2009
fDate
18-20 Dec. 2009
Firstpage
1
Lastpage
4
Abstract
The proposed method provides novel tradeoff solution to preserve spectral as well as spatial quality using fuzzy logic. It combines match measure, region based approach and fuzzy logic to produce quality pan sharp image. Standard pan-sharpening methods do not allow control of the spatial and spectral quality of the pan sharp image. Sugeno integral fuzzy logic model allows us to blend the benefits of match measure and region based segmentation in the final fused image. The simulation results of our proposed algorithm preserves more detailed spatial and spectral information and better visual quality compared to earlier reported methods. The simulations results are also compared with standard and recently proposed multispectral image fusion techniques.
Keywords
fuzzy logic; image fusion; image matching; image segmentation; integral equations; Sugeno integral fuzzy logic; image segmentation; match measure; multispectral image fusion; quality pan sharp image; region based pan sharpening; region based segmentation; spatial quality; spectral quality; visual quality; Energy measurement; Fuzzy logic; Fuzzy systems; Image fusion; Image segmentation; Multispectral imaging; Partitioning algorithms; Principal component analysis; Road transportation; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
India Conference (INDICON), 2009 Annual IEEE
Conference_Location
Gujarat
Print_ISBN
978-1-4244-4858-6
Electronic_ISBN
978-1-4244-4859-3
Type
conf
DOI
10.1109/INDCON.2009.5409488
Filename
5409488
Link To Document