Optimum parameters in the design of electrooptic waveguide modulators using ferroelectric thin films

The need of high speed integrated optical devices for optical communication has resulted in a great interest in ferroelectric materials. Thin films of (Pb,La),(Zr,Ti)O₃ have been extensively studied for making integrated optic devices since they are expected to have high electrooptic effects. The purpose of this work is to define the effect of opto-geometrical parameters on the waveguiding performance. To design the complete two-dimensional structure, we have utilized the effective index and beam propagation methods to predict main parameters (such as mode cut-offs, propagation constant, field distribution, propagation attenuation, etc....) for transverse electric (TE) and transverse magnetic (TM) polarizations