Title :
The model of measuring melons´ sugar based on resistance and capacitance
Author :
Liu, Mei ; Jia, Zhenhong ; Yao, Yongbo ; Huang, Xiaohui
Author_Institution :
Coll. of Inf. Sci. & Eng., Xinjiang Univ., Urumqi, China
Abstract :
In this work, a nondestructive method based on the dielectric properties for the measurement of melons´ sugar was presented. Resistance and capacitance of melons were obtained to predict the sweetness, using the genetic algorithm (GA) to optimize the parameters of its nuclear function (RBF), adopting Least Squares Support Vector Machines (LS-SVM) to obtain the sugar. The results showed that the precision was high under low cost condition, which could make available for use in the development of rapid and nondestructive sensors of melons.
Keywords :
agricultural products; chemical variables measurement; dielectric properties; electronic tongues; genetic algorithms; least squares approximations; nondestructive testing; production engineering computing; quality control; sugar; support vector machines; LS-SVM; capacitance; dielectric properties; genetic algorithm; least squares support vector machines; melons; nondestructive method; nondestructive sensors; nuclear function; optimization; resistance; sugar sweetness measurement; Capacitance; Capacitance measurement; Dielectrics; Electrical resistance measurement; Genetic algorithms; Resistance; Training;
Conference_Titel :
Advanced Computational Intelligence (IWACI), 2011 Fourth International Workshop on
Conference_Location :
Wuhan
Print_ISBN :
978-1-61284-374-2
DOI :
10.1109/IWACI.2011.6159969
