DocumentCode :
3416262
Title :
Nondestructive inspection of melon´s sugar content based on impedance characteristics
Author :
Yao, Yong-Bo ; Jia, Zhen-Hong ; Liu, Mei ; Huang, Xiao-Hui
Author_Institution :
Coll. of Inf. Sci. & Eng., Xinjiang Univ., Urumqi, China
fYear :
2011
fDate :
19-21 Oct. 2011
Firstpage :
37
Lastpage :
40
Abstract :
The objective of the study is to establish a model between the impedance characteristics and the sugar content of internal quality index of melons. The equivalent series resistor and equivalent series capacitor of melon are measured over the frequency from 1 KHz to 100 KHz by a LCR meter and an airtight shielding case. Then the impedance is calculated. Through principal component analysis (PCA), four principal components are selected to model for back propagation neural network (BPNN) optimized by genetic algorithm (GA). Comparing this method with BPNN and partial least squares (PLS), it is obviously showed that BPNN optimized by GA model is reliable and practicable. The inspecting results are assessed by correlation coefficient R=0.8413, and the root mean squares error of prediction RMSEP=0.762. A method is proposed to detect melon´s sweetness.
Keywords :
agricultural products; backpropagation; chemical variables measurement; electric impedance measurement; genetic algorithms; inspection; least mean squares methods; neural nets; nondestructive testing; principal component analysis; production engineering computing; quality control; sugar; BPNN; LCR meter; PCA; PLS method; back propagation neural network; equivalent series capacitor; equivalent series resistor; genetic algorithm; impedance characteristics; internal quality index; melon sugar content; melon sweetness detection; nondestructive inspection; optimization; partial least squares method; principal component analysis; root mean squares error method; Atmospheric modeling; Biological neural networks; Calibration; Educational institutions; Genetic algorithms; Impedance; Sugar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Computational Intelligence (IWACI), 2011 Fourth International Workshop on
Conference_Location :
Wuhan
Print_ISBN :
978-1-61284-374-2
Type :
conf
DOI :
10.1109/IWACI.2011.6159970
Filename :
6159970
Link To Document :
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