DocumentCode :
3416268
Title :
An ultra-small isolation area for 600V class reverse blocking IGBT with deep trench isolation process (TI-RB-IGBT)
Author :
Tokuda, Norifumi ; Kaneda, Mitsuru ; Minato, Tadaharu
Author_Institution :
power device works, Mitsubishi Electr. Corp., Fukuoka, Japan
fYear :
2004
fDate :
24-27 May 2004
Firstpage :
129
Lastpage :
132
Abstract :
We developed a 600 V class trench isolation RB-IGBT (TI-RB-IGBT), whose termination area is extremely small in comparison with other isolation techniques, such as diffusion isolation or silicon mesa etching. The TI area is not only very small but also almost identical for all the blocking voltage classes. Our fabricated 100 A class TI-RB-IGBT, with one micron rule planar gate structure, has more than 600 V blocking capability for both directions, and its trade-off relationship between the forward voltage drop Vce(sat) and the turn-off energy loss Eoff is slightly better than our previous punch through (PT) type third generation planar gated IGBT, even though it has an n-body and the backside collector structure is of the NPT type.
Keywords :
insulated gate bipolar transistors; isolation technology; power bipolar transistors; power field effect transistors; 100 A; 600 V; NPT type backside collector structure; TI-RB-IGBT termination area; bidirectional blocking capability; deep trench isolation process; forward voltage drop; planar gate structure; reverse blocking IGBT; turn-off energy loss; ultra-small isolation area; Insulated gate bipolar transistors; Isolation technology; Power FETs; Power bipolar transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on
Print_ISBN :
4-88686-060-5
Type :
conf
DOI :
10.1109/ISPSD.2004.1332879
Filename :
1332879
Link To Document :
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