Title :
EMC of Integrated Circuits : A Historical Review
Author :
Sicard, E. ; Ben Dhia, S. ; Ramdani, M. ; Hubing, T.
Author_Institution :
INSA, Toulouse
Abstract :
This paper provides a non exhaustive review of the research work conducted in the field of integrated circuit electromagnetic compatibility over the past 40+ years.
Keywords :
circuit simulation; electromagnetic compatibility; integrated circuits; radiofrequency interference; electromagnetic compatibility; historical review; integrated circuit simulation; parasitic emission; radiofrequency interference; CMOS technology; Circuit simulation; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Electronics packaging; Integrated circuit modeling; Radio frequency; Radiofrequency interference; SPICE;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
DOI :
10.1109/ISEMC.2007.94
