DocumentCode

3416883

Title

Test Techniques and Trade-offs for Embedded Cores and Systems

Author

Parekhji, Rubin A.

Author_Institution

Texas Instruments (India) Ltd.

fYear

2000

fDate

2000

Firstpage

5

Lastpage

5

Keywords

Automatic testing; Automation; Costs; Digital signal processing; Instruments; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 2000. Thirteenth International Conference on

ISSN

1063-9667

Print_ISBN

0-7695-0487-6

Type

conf

DOI

10.1109/ICVD.2000.812572

Filename

812572