DocumentCode :
3416905
Title :
Razor Blade Functions in the PEEC Method
Author :
Vahrenholt, Volker ; Brüns, Heinz-Dietrich ; Singer, Hermann
Author_Institution :
Tech. Univ. of Hamburg, Hamburg
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
1
Lastpage :
6
Abstract :
Modern electrical devices are of particular concern in terms of electromagnetic compatibility (EMC). Various numerical methods have been developed for EMC problems. One of those numerical methods is the partial element equivalent circuit (PEEC) approach, which was basically developed in order to combine electrical circuits and electromagnetic problems, because a circuit formulation of the electrical devices can be achieved. The standard PEEC formulation uses the Galerkin method in order to transform the EFIE into an equation system and rectangular source functions are taken in order to apply analytical integration formulas. In this paper, the new possibility to apply razor blade functions is presented in order to allow the application of numerical integration within nearly the same computation time as the analytical way. In addition, a higher accuracy is achieved, because Green´s function can totally be integrated including the retardation term. Examples are presented within this paper in order to show that a good agreement is obtained between the Galerkin PEEC, the PEEC based on razor blade testing and a method of moments simulation (MoM), which is applied for validation.
Keywords :
Green´s function methods; electromagnetic compatibility; equivalent circuits; integration; method of moments; EMC; Green´s function; PEEC method; electromagnetic compatibility; method of moments simulation; numerical integration; partial element equivalent circuit method; razor blade functions; Blades; Circuit simulation; Circuit testing; Electromagnetic compatibility; Equations; Equivalent circuits; Green´s function methods; Linear circuits; Moment methods; Telephony;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
Type :
conf
DOI :
10.1109/ISEMC.2007.107
Filename :
4305687
Link To Document :
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