Title :
CNT/graphene technologies for future carbon-based interconnects
Author :
Nihei, Mizuhisa ; Kawabata, Akio ; Murakami, Toshiyuki ; Sato, Mitsuhisa ; Yokoyama, Naoki
Author_Institution :
Collaborative Res. Team Green Nanoelectron. Center (GNC), Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
With the aim of achieving low-power consumption, high-performance LSIs, our work focuses on the development of low-resistance carbon nanotube (CNT)/graphene interconnect technologies. For vertical interconnects, we report on a previously unseen dense vertical and horizontal graphene (DVHG) structure, which is expected to lead to a low electrical resistance. For horizontal interconnects, we have succeeded in forming multi-layer graphene (MLG) directly on SiO2 by annealing sputtered amorphous carbon. Furthermore, achieving low-resistance contacts between the vertical CNTs and horizontal graphene represents a critical issue for 3D interconnects. We grew vertically aligned CNTs on MLG, and analyzed the contact structure using cross-sectional TEM-EELS measurements. Migration of Ti and Co into the graphene layers was clearly observed. This may contribute to the reduction of contact resistance between CNTs and graphene.
Keywords :
annealing; carbon nanotubes; cobalt; contact resistance; electromigration; graphene; integrated circuit interconnections; large scale integration; low-power electronics; titanium; 3D interconnects; C; CNT/graphene technologies; Co; SiO2; Ti; annealing; carbon-based interconnects; contact resistance; contact structure; cross-sectional TEM-EELS measurements; dense horizontal graphene structure; dense vertical graphene structure; electrical resistance; graphene interconnect technologies; graphene layers; high-performance LSI; horizontal interconnects; low-power consumption; low-resistance carbon nanotube; low-resistance contacts; multilayer graphene; sputtered amorphous carbon; vertical CNT; vertical interconnects; Argon; Etching; Films; Graphene; Integrated circuit interconnections; Resistance; Silicon;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467676