Title :
Enhanced short-circuit withstanding capability of the emitter switched thyristor (EST) by employing a new protection circuit
Author :
Jeon, Byung-Chul ; Ji, In-Hwan ; Kim, Soo-Seong ; Lee, Seung-Chul ; Choi, Yearn-Ik ; Han, Min-Koo
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
A new protection circuit, which improves the short-circuit withstanding capability of an emitter switched thyristor (EST) is proposed and fabricated. Experimental results show that the EST employing the protection circuit exhibits a high voltage current saturation when the protection circuit reduces the gate voltage. We have also investigated the mechanism by employing two-dimensional simulation.
Keywords :
overcurrent protection; short-circuit currents; thyristors; EST protection circuit; emitter switched thyristor; gate voltage reduction; high voltage current saturation; thyristor short-circuit withstanding capability; Overcurrent protection; Short circuit currents; Thyristors;
Conference_Titel :
Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on
Print_ISBN :
4-88686-060-5
DOI :
10.1109/ISPSD.2004.1332919
