• DocumentCode
    3416958
  • Title

    Enhanced short-circuit withstanding capability of the emitter switched thyristor (EST) by employing a new protection circuit

  • Author

    Jeon, Byung-Chul ; Ji, In-Hwan ; Kim, Soo-Seong ; Lee, Seung-Chul ; Choi, Yearn-Ik ; Han, Min-Koo

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • fYear
    2004
  • fDate
    24-27 May 2004
  • Firstpage
    277
  • Lastpage
    280
  • Abstract
    A new protection circuit, which improves the short-circuit withstanding capability of an emitter switched thyristor (EST) is proposed and fabricated. Experimental results show that the EST employing the protection circuit exhibits a high voltage current saturation when the protection circuit reduces the gate voltage. We have also investigated the mechanism by employing two-dimensional simulation.
  • Keywords
    overcurrent protection; short-circuit currents; thyristors; EST protection circuit; emitter switched thyristor; gate voltage reduction; high voltage current saturation; thyristor short-circuit withstanding capability; Overcurrent protection; Short circuit currents; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on
  • Print_ISBN
    4-88686-060-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.2004.1332919
  • Filename
    1332919
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3416958