Title :
Core Based ASIC Design
Author :
Higgins, Frank ; Bhawmik, Sudipta
Author_Institution :
Lucent Technologies
Keywords :
Application specific integrated circuits; Integrated circuit testing; Logic; Productivity; Qualifications; System testing;
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Print_ISBN :
0-7695-0487-6
DOI :
10.1109/ICVD.2000.812576
