DocumentCode
3416999
Title
High-density laminate substrates using a non-subtractive manufacturing process
Author
Lott, John W. ; Kraus, Richard K. ; Murphy, Cynthia F.
Author_Institution
DuPont Electron. Mater., Research Triangle Park, NC, USA
fYear
1997
fDate
2-4 Apr 1997
Firstpage
75
Lastpage
80
Abstract
Construction of conventional laminate substrates entails the use of subtractive processes, which have a significant waste and a high environmental impact. In addition, there are circuit density limitations associated with these materials and processes, especially when accounting for cost and yield. In order to address these issues, a DARPA-funded consortial project was initiated, with material suppliers, fabricators, and original equipment manufacturers (OEMs) as participants. The objective of the project is to investigate the materials and associated processes required to build environmentally-conscious, cost-effective, high-density printed wiring boards (PWBs) compatible with direct chip attach (DCA) and other multichip module (MCM)-type applications. Aqueous-developed photodielectric dry film is used in conjunction with several metallization approaches, including electroless copper and conductive ink, to form both vias and circuit traces. This paper will discuss material and process development, test vehicle design and test results, scale-up in a production facility, and environmental impact studies
Keywords
environmental factors; laminates; metallisation; multichip modules; printed circuit manufacture; substrates; Cu; DARPA-funded consortial project; MCM applications; aqueous-developed photodielectric dry film; circuit traces formation; conductive ink; cost-effective PWBs; direct chip attach applications; electroless Cu; environmental impact studies; environmentally-conscious PWBs; high-density PWBs; high-density laminate substrates; material development; metallization; multichip module; nonsubtractive manufacturing process; printed wiring boards; process development; production facility; test vehicle design; vias; Circuit testing; Conducting materials; Conductive films; Laminates; Manufacturing; Materials testing; Metallization; Multichip modules; Substrates; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Multichip Modules, 1997., International Conference on
Conference_Location
Denver, CO
Print_ISBN
0-7803-3787-5
Type
conf
DOI
10.1109/ICMCM.1997.581151
Filename
581151
Link To Document