• DocumentCode
    3417020
  • Title

    Reliability of large conductive polymer flip chip assemblies for multichip modules (MCMs)

  • Author

    Schaper, Leonard ; Maner, Kaoru ; Ang, Simon

  • Author_Institution
    HiDEC, Arkansas Univ., Fayetteville, AR, USA
  • fYear
    1997
  • fDate
    2-4 Apr 1997
  • Firstpage
    87
  • Lastpage
    91
  • Abstract
    Work has already been reported on two thermoset adhesives for solder replacement flip chip attachment using both gold and copper flip chip test vehicles. The one drawback with any thermoset material is that rework is difficult should there be a failure after assembly so precise alignment is necessary. Thermoplastic material offers the advantage of reworking. This paper discusses work with thermoplastic epoxy. However, the new material being tested is so different from the previously tested conductive pastes that new fabrication and assembly procedures had to be developed. Initial work has begun in evaluating the performance of thermoplastic epoxy. Not only is this thermoplastic paste viscous enough to prevent smearing during the stencil printing process, but also rigid enough to create 2 mil height bumps by stencil printing twice onto the same substrate. Some disadvantages of this paste is that processes after the bumps are applied must be performed at low temperatures and the paste appears to be more compatible with palladium than gold
  • Keywords
    adhesion; assembling; conducting polymers; flip-chip devices; integrated circuit packaging; integrated circuit reliability; multichip modules; MCMs; assembly procedures; conductive polymer; flip chip assemblies; multichip modules; precise alignment; reliability; reworking; smearing; solder replacement flip chip attachment; stencil printing; thermoplastic epoxy; thermoset adhesives; Assembly; Conducting materials; Copper; Fabrication; Flip chip; Gold; Materials testing; Polymers; Printing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1997., International Conference on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-3787-5
  • Type

    conf

  • DOI
    10.1109/ICMCM.1997.581153
  • Filename
    581153