• DocumentCode
    3417033
  • Title

    Simple method for flip-chip bonding on a resin substrate

  • Author

    Matsuda, Kenji ; Fujiyama, Ippei ; Chigawa, Yasuhide

  • Author_Institution
    PFU Ltd., Ishikawa, Japan
  • fYear
    1997
  • fDate
    2-4 Apr 1997
  • Firstpage
    92
  • Lastpage
    97
  • Abstract
    The use of flip-chip bonding on resin substrates (FR-4) in the field of portable equipment has been increasing steadily due to demands for smaller and lighter equipment. The flip-chip bonding methods used for portable equipment require the presence of a solder or a conductive adhesive between the metal “bump” on the LSI chip and the electrode pad on the substrate. These materials have been generally considered critical to maintaining the reliability of the electrical contacts. However, the fine control in the manufacturing process required to spread the correct amount of solder or conductive adhesive paste on the minute electrical contacts is extremely difficult. Consequently, control of the soldering or adhesive process proved to be critical factor influencing the cost of the flip-chip bonding process. We have developed a new manufacturing process for flip-chip bonding that requires neither solder nor conductive adhesive paste. Thermal cycling tests (-40°C to 100°C 2500 cycles) and high temperature/high humidity tests (+85°C 85% RH 3500 H) indicate acceptable reliability, and initial process yields reached 99.6% or more. We then used the new flip-chip process to build portable Windows-based equipment for testing purposes and thus confirmed the effectiveness of this new technology. This paper presents the method of our simple flip-chip bonding technique
  • Keywords
    flip-chip devices; humidity; integrated circuit packaging; integrated circuit yield; large scale integration; -40 to 100 degC; LSI chip; PWB; electrode pad; flip-chip bonding; high humidity tests; manufacturing process; portable equipment; process yields; resin substrate; thermal cycling tests; Bonding; Conducting materials; Conductive adhesives; Contacts; Electrodes; Large scale integration; Maintenance; Manufacturing processes; Resins; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1997., International Conference on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-3787-5
  • Type

    conf

  • DOI
    10.1109/ICMCM.1997.581154
  • Filename
    581154