DocumentCode
3417137
Title
Stud-bump bonding technique onto an advanced organic substrate for MCM-Ls
Author
Shiraishi, Tsukasa ; Amami, Kazuyoshi ; Yuhaku, Satoru ; Bessho, Yoshiriro ; Eda, Kazuo ; Ishida, Toru
Author_Institution
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
fYear
1997
fDate
2-4 Apr 1997
Firstpage
109
Lastpage
114
Abstract
This paper describes the result of our study that bare LSI chips are mounted directly onto the “ALIVHTM” (any layer inner via hole) substrate by using Stud-Bump-Bonding (SBBTM ) technique, which has been developed by us. The SBBTM technique is an advanced flip-chip bonding technique, for high density Multi-Chip-Modules (MCMs), which can mount bare LSI chips directly onto substrates. The structure of the bonding portion is composed of Au bumps having two-stepped construction and conductive adhesives. The conductive adhesive is very flexible in bond, thus relaxing thermal and mechanical stresses. The ALIVHTM substrate has been developed in our laboratory. It is a high density and high performance multi-layered printed wiring board with any layer inner via hole structure, via hole processing technology using a CO2 laser and interconnection technology that employs conductive paste. We had good results for several reliability tests in the test vehicles of MCM-ALIVHTM. Especially, in the thermal shock test, the increase of connecting resistance in MCM-ALIVHTM was smaller than that of MCM-Ls which used ordinary organic substrates in stead of the ALIVHTM substrate. The combination of SBBTM technique and the ALIVHTM substrate is promising for miniaturized, light-weighted, high speed (high frequency), and high quality in MCMs
Keywords
adhesion; flip-chip devices; integrated circuit packaging; large scale integration; multichip modules; organic compounds; substrates; ALIVH; Au; CO2 laser processing; LSI chip; MCM-L; any layer inner via hole; conductive adhesive; flip-chip bonding; interconnection technology; multi-chip module; multi-layered printed wiring board; organic substrate; reliability; stud-bump bonding; thermal shock testing; Bonding; Conductive adhesives; Gold; Laboratories; Large scale integration; Testing; Thermal conductivity; Thermal resistance; Thermal stresses; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Multichip Modules, 1997., International Conference on
Conference_Location
Denver, CO
Print_ISBN
0-7803-3787-5
Type
conf
DOI
10.1109/ICMCM.1997.581157
Filename
581157
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