• DocumentCode
    3417137
  • Title

    Stud-bump bonding technique onto an advanced organic substrate for MCM-Ls

  • Author

    Shiraishi, Tsukasa ; Amami, Kazuyoshi ; Yuhaku, Satoru ; Bessho, Yoshiriro ; Eda, Kazuo ; Ishida, Toru

  • Author_Institution
    Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
  • fYear
    1997
  • fDate
    2-4 Apr 1997
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    This paper describes the result of our study that bare LSI chips are mounted directly onto the “ALIVHTM” (any layer inner via hole) substrate by using Stud-Bump-Bonding (SBBTM ) technique, which has been developed by us. The SBBTM technique is an advanced flip-chip bonding technique, for high density Multi-Chip-Modules (MCMs), which can mount bare LSI chips directly onto substrates. The structure of the bonding portion is composed of Au bumps having two-stepped construction and conductive adhesives. The conductive adhesive is very flexible in bond, thus relaxing thermal and mechanical stresses. The ALIVHTM substrate has been developed in our laboratory. It is a high density and high performance multi-layered printed wiring board with any layer inner via hole structure, via hole processing technology using a CO2 laser and interconnection technology that employs conductive paste. We had good results for several reliability tests in the test vehicles of MCM-ALIVHTM. Especially, in the thermal shock test, the increase of connecting resistance in MCM-ALIVHTM was smaller than that of MCM-Ls which used ordinary organic substrates in stead of the ALIVHTM substrate. The combination of SBBTM technique and the ALIVHTM substrate is promising for miniaturized, light-weighted, high speed (high frequency), and high quality in MCMs
  • Keywords
    adhesion; flip-chip devices; integrated circuit packaging; large scale integration; multichip modules; organic compounds; substrates; ALIVH; Au; CO2 laser processing; LSI chip; MCM-L; any layer inner via hole; conductive adhesive; flip-chip bonding; interconnection technology; multi-chip module; multi-layered printed wiring board; organic substrate; reliability; stud-bump bonding; thermal shock testing; Bonding; Conductive adhesives; Gold; Laboratories; Large scale integration; Testing; Thermal conductivity; Thermal resistance; Thermal stresses; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1997., International Conference on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-3787-5
  • Type

    conf

  • DOI
    10.1109/ICMCM.1997.581157
  • Filename
    581157