Title :
Colaminated single and multichip package development
Author :
Ernsberger, Craig W. ; Thomas, Sunil
Author_Institution :
Dept. of Electron. Packaging, CTS Corp., Elkhart, IN, USA
Abstract :
Next generation single and multichip packages must support flip chip assembly of die with a very high number of I/O. Cofire ceramic technology has been the traditional solution. We report on a new packaging technology that, in many ways, is an organic version Cofire ceramic. This “Colamination” process leverages recent developments in adhesiveless flex circuitry and low temperature sinterable materials to produce multilayer structures with sintered blind and buried vias in a single lamination step. This paper describes the fabrication of a 6-metal layer 751 I/O flip chip test vehicle with the Colamination process. NovacladTM flex circuit layer pairs, ViaPlyTM bond ply layers, and a metal stiffener are colaminated to form the package substrate. The package design takes advantage of NovacladTM design rules, which includes microvias in die attach and BGA pads. Test vehicle design, substrate fabrication, flip chip assembly, thermomechanical, and environmental test results are described
Keywords :
flip-chip devices; laminates; multichip modules; packaging; sintering; BGA pad; Novaclad flex circuit; ViaPly bond ply layer; blind via; buried via; colamination; die attach; environmental testing; flip chip assembly; low temperature sintering; metal stiffener; multichip package; multilayer organic interconnect; single chip package; substrate fabrication; test vehicle design; thermomechanical testing; Assembly; Ceramics; Circuit testing; Fabrication; Flexible printed circuits; Flip chip; Nonhomogeneous media; Packaging; Temperature; Vehicles;
Conference_Titel :
Multichip Modules, 1997., International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-3787-5
DOI :
10.1109/ICMCM.1997.581161