Title :
Manufacturing and test considerations in system-on-chip designs
Author_Institution :
Level One Commun. Inc., Sacramento, CA, USA
Abstract :
In order to take costs into account, there needs to be proper cost models at every stage in the design cycle. These cost models must be able to compute SoC cost in terms of design characteristics that are available at the given design stage. This session describes the impact of cost at four stages in the design cycle: (a) architecture; (b) synthesis; (c) layout; and (d) test. This will be done using data from example industrial SoCs. In addition, methodologies to reduce costs at each of these three stages will be proposed
Keywords :
VLSI; application specific integrated circuits; integrated circuit design; integrated circuit manufacture; integrated circuit testing; cost models; design characteristics; design cycle; industrial SoCs; layout; system-on-chip designs; test; test considerations; Acceleration; Application specific integrated circuits; Clocks; Costs; Design for manufacture; Graphics; Manufacturing; Radio frequency; System testing; System-on-a-chip;
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location :
Calcutta
Print_ISBN :
0-7695-0487-6
DOI :
10.1109/ICVD.2000.812605