DocumentCode :
3417430
Title :
Manufacturing and test considerations in system-on-chip designs
Author :
d´Abreu, M.
Author_Institution :
Level One Commun. Inc., Sacramento, CA, USA
fYear :
2000
fDate :
2000
Firstpage :
176
Lastpage :
177
Abstract :
In order to take costs into account, there needs to be proper cost models at every stage in the design cycle. These cost models must be able to compute SoC cost in terms of design characteristics that are available at the given design stage. This session describes the impact of cost at four stages in the design cycle: (a) architecture; (b) synthesis; (c) layout; and (d) test. This will be done using data from example industrial SoCs. In addition, methodologies to reduce costs at each of these three stages will be proposed
Keywords :
VLSI; application specific integrated circuits; integrated circuit design; integrated circuit manufacture; integrated circuit testing; cost models; design characteristics; design cycle; industrial SoCs; layout; system-on-chip designs; test; test considerations; Acceleration; Application specific integrated circuits; Clocks; Costs; Design for manufacture; Graphics; Manufacturing; Radio frequency; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location :
Calcutta
ISSN :
1063-9667
Print_ISBN :
0-7695-0487-6
Type :
conf
DOI :
10.1109/ICVD.2000.812605
Filename :
812605
Link To Document :
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