• DocumentCode
    3417637
  • Title

    A framework for the management of MCM test strategies

  • Author

    Dislis, C. ; Alani, A.F. ; Jalowiecki, I.P.

  • Author_Institution
    Dept. of Cybern., Reading Univ., UK
  • fYear
    1997
  • fDate
    2-4 Apr 1997
  • Firstpage
    272
  • Lastpage
    277
  • Abstract
    This paper will present a framework for the management and optimisation of MCM test strategies, and describe a software tool developed for the purpose, based on economics models. MCMs can suffer from low system yield, and the final cost and quality are highly sensitive to the choice of test strategy. The framework presented is an end-to end cost and quality model of the MCM manufacture and test process from die procurement and KGD strategy to final test and rework, and provides a powerful means of test strategy evaluation and optimisation tailored to the project and the organisation. The paper presents an outline of the tool, together with the outcome of a case study evaluated using this framework
  • Keywords
    economics; integrated circuit manufacture; integrated circuit testing; multichip modules; production testing; quality control; KGD strategy; MCM test strategies; cost; die procurement; economics models; quality; rework; software tool; strategy evaluation; system yield; Cost function; Manufacturing processes; Power generation economics; Power system modeling; Procurement; Software development management; Software testing; Software tools; System testing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1997., International Conference on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-3787-5
  • Type

    conf

  • DOI
    10.1109/ICMCM.1997.581188
  • Filename
    581188