A new definition and a new class of sequential circuits with combinational test generation complexity

Author

Fujiwara, Hideo

Author_Institution

Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan

fYear

2000

fDate

2000

Firstpage

288

Lastpage

293

Abstract

We introduce a new class of sequential circuits with combinational test generation complexity which we call internally balanced structures. It is shown that sequential circuits can be classified by their structure as follows: (sequential circuits of acyclic structure)⊃(sequential circuits of internally balanced structure)⊃(sequential circuits of balanced structure) and that internally balanced structures allow test generation with combinational test generation complexity. On the other hand, if finite state machines (FSMs) are classified by their realization possibility, it can be shown that (FSMs which can be realized as a sequential circuit of acyclic structure)=(FSMs which can be realized as a sequential circuit of internally balanced structure)⊃(FSMs which can be realized as a sequential circuit of balanced structure). In addition, we discuss the definition of test generation possibility with combinational test generation complexity and introduce a new definition which covers the previous narrow definition

Keywords

finite state machines; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; FSM classification; acyclic structure; combinational test generation complexity; finite state machines; internally balanced structures; sequential circuits; Circuit testing; Combinational circuits; Design for testability; Design methodology; Flip-flops; Information science; Large-scale systems; Sequential analysis; Sequential circuits; Shift registers;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 2000. Thirteenth International Conference on

Conference_Location

Calcutta

ISSN

1063-9667

Print_ISBN

0-7695-0487-6

Type

conf

DOI

10.1109/ICVD.2000.812623

Filename

812623